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About SEICHITECH
Products
Support
Technology Innovations
Investors
Careers
Newsroom
Probe Card
Empowering chips with micro contacts to unleash their ultimate performance
Memory ATE
Burn-in Equipment
Testers
SoC ATE
SoC ATE
AMOLED Inspection Equipment
Signal Generator
Module Process Equipment
Cell Process Equipment
Probe Card
Probe Card
XR Inspection Equipment
Wafer Inspection
Micro-display Module Aging
Micro-display Module Inspection
Near-eye Display (NED) Inspection
Signal Generator
Optical Instrument
Probe Card
MEMS Probe Card
探针卡是晶圆测试环节的核心电性互联载体，可实现测试机与被测芯片间的精准信号传输，通过稳定的通路连接完成芯片电性能参数的高效测试，是保障晶圆良率与性能验证的关键部件。...
