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  • About SEICHITECH
  • Products
  • Support
  • Technology Innovations
  • Investors
  • Careers
  • Newsroom
Reinforcing reliable memory to secure the foundation of AI data
Memory ATE
Reinforcing reliable memory to secure the foundation of AI data
Memory ATE
  • Burn-in Equipment
  • Testers
SoC ATE
  • SoC ATE
AMOLED Inspection Equipment
  • Signal Generator
  • Module Process Equipment
  • Cell Process Equipment
Probe Card
  • Probe Card
XR Inspection Equipment
  • Wafer Inspection
  • Micro-display Module Aging
  • Micro-display Module Inspection
  • Near-eye Display (NED) Inspection
  • Signal Generator
  • Optical Instrument
  • Testers

    Unified Design & Debug System

    S9120 is a miniaturized DRAM tester that supports testing of DDR4, DDR5, LPDDR4, LPDDR5 chips, and DDR4 and DDR5 DIMMs. It is mainly used by R&D and test engineers to...

    Unified Design&Debug System_F
  • Chip Probing Tester

    S9930 is a high-speed, high-precision DRAM chip probing and repair equipment launched by SEICHITECH to improve DRAM test efficiency and accuracy while reducing test costs....

    Chip Probing Tester_F
  • High Speed Final Tester

    S9880 is a high-speed, high-precision DRAM chip tester launched by SEICHITECH to improve DRAM test efficiency and accuracy while reducing test costs....

    High Speed Final Tester_F
Contact Information:

0755-83188629 - ext. 8001

Investors: jzd@seichitech.com

Support: sales@seichitech.com

Company Address:

52/F, Kingdee Cloud Tower, No.2 Keji South 12th Road, Nanshan District, Shenzhen

1/F, Building D, Fuanna Longhua Industrial Park, No.1 Qingning Road, Longhua District, Shenzhen

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