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  • About SEICHITECH
  • Products
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Optimizing cost and efficiency to make excellent display accessible to all
AMOLED Inspection Equipment
Optimizing cost and efficiency to make excellent display accessible to all
Memory ATE
  • Burn-in Equipment
  • Testers
SoC ATE
  • SoC ATE
AMOLED Inspection Equipment
  • Signal Generator
  • Module Process Equipment
  • Cell Process Equipment
Probe Card
  • Probe Card
XR Inspection Equipment
  • Wafer Inspection
  • Micro-display Module Aging
  • Micro-display Module Inspection
  • Near-eye Display (NED) Inspection
  • Signal Generator
  • Optical Instrument
  • Signal Generator

    Cell Pattern Generator

    Cell Pattern Generator is mainly used for cell defect inspection and white balance adjustment of OLED and LCD panels. Its internal circuits use advanced FPGA technology for highly real-time...

    Cell检测信号发生器(OMF)-封面图
  • Programmable Signal Generator for Module Aging

    Used for module testing at both high and room temperatures, the MDL aging PG outputs continuous, stable full-screen or cycling test signals (e.g., solid color, checkerboard, rolling...

    模组老化信号发生器AMF-封面图
  • Programmable Signal Generator for Module Test

    The Module (MDL) Programmable Signal Generator generates standard image and control signals and applies power supply voltages to the display module under test to complete display testing,...

    模组检测信号发生器(AMF)-封面图
Contact Information:

0755-83188629 - ext. 8001

Investors: jzd@seichitech.com

Support: sales@seichitech.com

Company Address:

52/F, Kingdee Cloud Tower, No.2 Keji South 12th Road, Nanshan District, Shenzhen

1/F, Building D, Fuanna Longhua Industrial Park, No.1 Qingning Road, Longhua District, Shenzhen

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