Tsinghua-SEICHITECH Joint Research Center Launched to Establish New Benchmark for AI-Powered Advanced Memory Test

Shenzhen, China, April 26, 2026 — SEICHITECH and Tsinghua University have officially inaugurated the “Tsinghua-SEICHITECH Joint Research Center for AI‑Powered Advanced Memory Test Systems” at Tsinghua University.

The center was jointly unveiled by Wu Huaqiang, Vice President of Tsinghua University, and Zhang Bin, Chairman of Shenzhen SEICHITECH Technologies Co., Ltd. The ceremony was hosted by Yin Shouyi, Dean of the School of Integrated Circuits at Tsinghua University, with leaders, experts, faculty, and student representatives from both sides in attendance.

The inauguration marks a new phase of strategic collaboration between the two parties, building on their earlier cooperation from 2023 to 2026 and seizing the opportunities presented by the rapid growth of the advanced memory industry in the AI era. During the previous cooperation, the School of Integrated Circuits at Tsinghua University and the SEICHITECH team worked closely on core memory test technologies, achieving breakthroughs in key areas such as algorithmic logic vector generation (ALPG) and MEMS probe cards — filling critical technology gaps in China and establishing a solid technical and trust foundation for deepening their partnership.

In this new phase, both parties will fully leverage the academic and talent strengths of Tsinghua’s School of Integrated Circuits, combined with SEICHITECH’s engineering and industrialization capabilities, to pursue three core missions: technology leadership, industrial implementation, and talent development. Together, they aim to build an intelligent test equipment system for next-generation advanced memory.

The collaboration will span the entire chain from fundamental research and technology breakthroughs to industrial application, striving for original innovations in core technologies and accelerating the translation of academic achievements into scalable, market-ready test equipment to enhance the security and efficiency of China’s domestic memory industry chain.

Vice President Wu Huaqiang: A Strategic Move Toward Innovation Leadership

“In April 2023, the School of Integrated Circuits at Tsinghua University and SEICHITECH established a joint research center for next-generation memory test systems, achieving a complete domestically developed breakthrough in key technologies such as algorithmic logic vector generation (ALPG) — from theoretical algorithms and chip architecture to full system integration,” said Wu Huaqiang, Vice President of Tsinghua University.

“As we enter the ’15th Five-Year Plan’ period, the integrated circuit industry is entering the second half of its journey — achieving innovation leadership. The establishment of this joint research center around AI-powered advanced memory test systems is an innovative, forward-looking, and strategic move that is expected to elevate China’s advanced memory test technology to new heights. We hope both sides will work closely together in this new phase to make greater contributions to transforming China’s memory testing landscape from ‘self-reliant’ to ‘globally leading’.”

Chairman Zhang Bin: Three Core Missions for the Joint Research Center

“Artificial intelligence is profoundly reshaping the world, and the foundation of AI lies in the performance and reliability of semiconductor memory,” said Zhang Bin, Chairman of SEICHITECH. “From HBM to next-generation memory architectures, the iteration cycles of advanced memory chips are rapidly shortening, placing unprecedented demands on test intelligence, precision, and full-chain coverage. However, the memory test equipment market has long been dominated by foreign giants, and China still faces many bottlenecks in this field. This is a challenge that we, as the semiconductor generation, must tackle head-on.”

Zhang outlined the three core missions of the joint research center:

• Technology leadership — achieving original breakthroughs in cutting-edge memory test technologies.
• Industrial implementation — serving the security and efficiency enhancement of China’s domestic memory industry chain.
• Talent development — creating an innovation hub and talent pool in the advanced memory test field.

“In this renewed partnership with Tsinghua, SEICHITECH will invest its best resources and assemble its most capable teams to work closely with Tsinghua faculty and students, striving to deliver milestone results as soon as possible,” Zhang added.

Academic Reports

Following the inauguration ceremony, a senior market expert from SEICHITECH and Professor Su Fei from Tsinghua’s School of Integrated Circuits delivered academic reports titled “Advanced Memory Test and ATE Technology Development: Challenges, Opportunities, and Intelligent Trends” and “AI-Powered Advanced Memory Test: Toward an Intelligent Test System.” The reports thoroughly analyzed industry pain points in advanced memory testing and systematically explored the transformative opportunities that AI technologies bring to the test field, as well as the broad potential for industry-academia-research collaboration.

Moving forward, SEICHITECH will take this inauguration as a new starting point to deepen collaborative innovation with Tsinghua University, striving to propel China’s memory test technology from a position of “catching up” to “leading.” The company aims to inject strong momentum into securing the security of China’s semiconductor industry chain and supply chain, and achieving high-level technological self-reliance.